The PXI 3060 Series of RF combiners offer a variety of RF signal conditioning and interconnection possibilities for test system integrators. The modules are ideally suited for use in conjunction with PXI 3000 Series RF signal generators and RF digitizer modules. Together these modules enable the development of compact, high-performance, low-cost, modular RF test systems.
3066 provides multiple configurable forward and reverse signal paths with amplification and power combiner/dividers in a single 2 slot wide PXI module.
3066 is ideal for any ATE system development where stimulus and response RF test resources need to be multiplexed or shared between multiple test ports. It is particularly well suited to mobile UE RF transceiver test applications such as smartphones, wireless access points and routers which all have multiple antenna connections either for MIMO or multi radio technologies.
Four device under test port connections are provided. Each be configured as input ports, output ports or in/out ports.
RF in and RF out port interface with external signal analyzer and signal generator test resources
The 3060 Series RF combiners simplify test fixture design
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