7700 Integrated Microwave Test Solution

  • Overview
  • Features
  • Literature
  • Technical Data

The 7700 is a complete automated test system housed in an incredibly small footprint. The solution includes a fully-functional test executive called the Aeroflex Measurement Console (AMC). Using the production test sequences provided with the base model, the 7700 includes the capability to emulate the functionality of the following instrumentation:

  • Vector signal generator
  • Spectrum analyzer
  • Vector network analyzer
  • Oscilloscope
  • Power meter
  • Frequency counter
  • Noise figure meter
  • Microwave transition analyzer

The 7700 does not just replace test equipment. It is a fully integrated ATE solution that has the capability to control all aspects of production test including the DUT, remote switching hardware, thermal chambers, etc.

A Complete RF Test Environment

  • Delivered ready to test with a full-featured execution and development environment
  • Full set of common RF measurements
  • Fully integrated Device Under Test (DUT) control and power
  • Fully integrated control of peripherals such as temperature chambers
  • Architected to support ATE

Complex Device Testing Capable

  • Frequency range 1 MHz to 6 GHz (expandable to 26.5 GHz)
  • Complete measurement suite including S-parameters for full characterization of devices such as LNAs, VCOs, and transceiver modules
  • Control of device states built into measurements

A True Synthetic Architecture

  • Utilizes a common set of hardware for all stimulus and response functions
  • Smaller footprint than traditional “rack and stack” instruments
  • Mature system level calibration scheme
  • Reduced hardware cost compared to full instrument-based test system
  • New capability can be incrementally added at low cost with little impact to existing measurement sequences

Specifications

  • Frequency Range: 1 MHz- 6 GHz
  • RF Modulation BW: 90 MHz
  • Frequency Switching Times: <1 msec
  • Output Power: >100 dB
  • Phase Noise (20 KHz offset): -115 dBc/Hz
  • Residual noise floor: <-120 dBm
  • Total Dynamic Range: 90 dB
  • DANL (1 Hz res bandwidth)
  • 0.1 to 1 GHz: -164 dBm/Hz
  • 1 to 3 GHz: -159 dBm/Hz

Literature

Title Version/
Part#
Date Download
7700 Integrated Multi-State Test Solution Brochure

Issue 1
3000FL

06-18-2015
Synthetic Test Systems Product Capabilities

Issue 2
3050DS

04-29-2014

Data Sheets

Title Version/
Part#
Date Download
7700 Data Sheet

Issue 4
46891/497

06-11-2015

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